English
企業情報
企業概要
マネージメント
Management
品質コミットメント
投資家情報
コンタクト先
IRレポート
Annual Reports
SEC Filings
音声公告
プレスリリース
株価情報
よくあるお問い合わせ
メトロロジーソリューション
Polishing
Dielectric CMP
Copper CMP
Poly Plug CMP
Patterning
Etch
Lithography
テクノロジー
Scatterometry
DUV Reflectometry
Scatterometry Algo
High Power Computation
Spectral Reflectometry
プロダクト
Optical CD & Shape Profiling
Standalone Metrology
Integrated Metrology
Thin Film Monitoring
Standalone Metrology
Integrated Metrology
Application Development
Technologies
ニュース&イベント
プレスリリース
マスメディア
テクニカル文書
Thin Film Products
イベント
Media Room
Media Contacts
Image Gallery
OCD & Shape Profiling
Appl. Develop
Corporate
サポート
サポートコミットメント
カスタマートレーニング
Training Policy
サポートコンタクト
採用情報
Nova Employment
お問い合わせ
Worldwide Offices
ホームページ
ニュース&イベント
プレスリリース
日付:
23.01.2012
Nova Measuring Instruments to Present at the Stifel Nicolaus Technology & Telecom Conference 2012 on February 7, 2012
10.01.2012
Nova’s metrology solutions are selected by a leading Logic manufacturer for development of advanced technology nodes
09.01.2012
Nova Reaffirms 2011 Guidance and Discusses Strategy to Position Company for Business Upturn
29.12.2011
Nova Measuring Instruments to Present at the 14th Annual Needham Growth Conference in New York on January 10, 2012
12.12.2011
Nova Receives over $7 Million Orders from a Leading Foundry in Asia
Company sees increase in overall bookings during the 4th quarter
05.12.2011
Nova is selected by leading Asian foundry to be the Tool of Record for its Most Advanced Technology Node
01.11.2011
NOVA ANNOUNCES 2011 THIRD QUARTER RESULTS
04.10.2011
Nova Measuring Instruments Schedules Third Quarter 2011 Results Conference Call for November 1, 2011 at 9 a.m. Eastern Time
03.10.2011
Nova Gains Market Share in Stand-Alone Optical CD with Selection and Repeat Orders by Major Foundry
06.09.2011
Nova Measuring Instruments to Present at the Annual Rodman & Renshaw Global Investment Conference on September 12, 2011
02.08.2011
NOVA ANNOUNCES 2011 SECOND QUARTER RESULTS
28.07.2011
Nova Measuring Instruments to Present at the Oppenheimer 14th Annual Technology Conference in Boston on August 9, 2011
13.07.2011
Nova Measuring Instruments Schedules Second Quarter 2011 Results Conference Call for August 2, 2011 at 9 a.m. Eastern Time
12.07.2011
Nova Unveils Multi-Channel NovaMARS® Software Engine for Advanced 3D Structures
11.07.2011
Nova Pushing the Limits of 3D Profile Metrology with New Optical CD System
Introducing the All-New Nova T600® with Multi-Channel Reflectometry • Innovative and unique optical configuration enables the move to vertical devices in next-generation memory and microprocessor chips • Built to Nova industry-leading stability and reliability standards • Extends range of Nova’s market leading high productivity Optical CD solutions
07.07.2011
Nova i500® Gains Market Recognition With Multiple Customers Orders
Nova receives multiple orders for its robust integrated metrology solution • Orders received from leading customers for advanced process nodes • Qualified to control key process steps for 3x technology nodes and below using enhanced Optical CD capability
04.05.2011
NOVA ANNOUNCES 2011 FIRST QUARTER RESULTS
Record bookings and backlog solidify continued growth
13.04.2011
Nova Measuring Instruments Schedules First Quarter 2011 Results Conference Call for May 4, 2011 at 9 a.m. Eastern Time
21.03.2011
Nova Announces the Establishment of A Local Branch in South Korea
Local facility will provide closer support to growing installed base of well over 200 systems
03.03.2011
Nova Receives $12 Million Orders from 3 Major Foundries
Orders are for both integrated and stand alone metrology tools
[1]
-
2
-
3
-
4
-
5
-
6
-
7
-
8
次へ
Site map
|
Terms of Use & Privacy Policy
著作権所有